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The reduction of wheat yields a number of ground products that are defined by particle size and density. Flour refinement or bran contamination has traditionally been measured using gravimetric (ash) and/or colorimetric (flour colour grade, Agtron) methods. Recent advances in technology have introduced tristimulus (L*a*b*), near infrared (NIR) and digital image analysis (DIA) methods as rapid nondestructive bran methods. DIA is the only rapid method that measures bran directly. Because bran specks are visually identified from starchy endosperm by their dark color, they are rapidly measured by the SPX as Bran Index.
| Bran Index | Benefits |
|---|---|
| Identifies new wheat crop | Reduces supplier issues |
| Controls milling process | Gives early warning when problems arise |
| Increases extraction rates | Monitors production efficiency |
| Delivers consistent flour quality | Correlates to baking performance |