Nutech Analytical, Inc. - SPY Grain Grader

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Introducing the SPY Grain Grader

In the past several years, many of our customers requested equipment that could quantify grain uniformity in order to maximize their processing efficiency. Maztech is pleased to introduce the SPY Grain Grader as the first image analysis benchtop instrument using linear CCD arrays to determine objective grade and non-grades factors in grains and seeds. On a per kernel basis, the SPY identifies and quantifies damage due to fungal diseases, surface discolorations, immature, skinned and brokens, color, size and shape characterisitcs. Current SPY applications include:

Red Wheat - Fusarium Damaged Kernels

Durum Wheat - Diseased and Discolored Kernels

Malting Barley - Diseased and Discolored Kernels

Morphology - Size and Shape of Kernels

Using proprietary digital technology, the SPY delivers objective rapid grain analysis 24 hours/day.

Select 500-900 kernels from a batch of clean seeds using the SPY sample picker.

Place them on the SPY sample holder, close the lid, engage the vacuum, and slide the holder into the SPY.

The sample holder can be turned over to image each side of the kernel.

Results are displayed on screen, saved for importation into a spreadsheet, and/or printed.

Image archiving is optional.

The SPY is a benchtop unit requiring a host PC with 500 MHz (CPU) and 128 MB (RAM) minimum running on Windows 95/98 or NT.

Maztech is constantly expanding the scope of SPY measurements and welcomes the opprotunity to verify your samples on the determinations listed OR to test samples for new applications that are not listed. Our team of application experts are prepared to evaluate your requirement and to suggest appropriate application scenarios. To receive information about the SPY contact Nutech.

SPY Grain Grader